非飽和蒸汽試驗/飽和蒸汽試驗
HAST具有濕氣老化加速性，可大程度縮短試驗在常規(guī)條件下的時間。
HAST適用于密封性能的檢測，加速壽命試驗，適用于產(chǎn)品的設計及驗證階段,用于快速暴露產(chǎn)品的缺陷和薄弱環(huán)節(jié)。
HAST適用于評估儲存在高溫/高濕度環(huán)境中的半導體等電子元件、材料的耐久性或因環(huán)境引發(fā)的失效性。

With high moisture aging and acceleration, the test can be reduced to a maximum of time under normal conditions.
It is suitable for the test of sealing performance and accelerated life test, which is applicable to the design and verification stage of the product, which is used for the quick exposure of defects and weak links of products.
It is applicable to evaluate the durability of semiconductor devices stored in high temperature/high humidity environments.

備注
1.設備性能在環(huán)境溫度+25℃，相對濕度65%RH下，無負載所測。The performance vulues refer to environmental +25℃ 65%RH,no loading.
2.外形尺寸未包含局部突出部分。The ledge is not included in the overall dimensions.